000000215 001__ 215 000000215 005__ 20231130114542.0 000000215 0247_ $$2DOI$$a10.6083/M46M34RJ 000000215 037__ $$aETD 000000215 245__ $$aA study of effect of precipitates and lattice defects on the electrical performance of P-N junctions 000000215 260__ $$bOregon Graduate Center 000000215 269__ $$a1986 000000215 336__ $$aDissertation 000000215 502__ $$bPh.D. 000000215 540__ $$fCC BY 000000215 542__ $$fIn copyright - single owner 000000215 650__ $$aSemiconductors$$025858 000000215 6531_ $$aion implantation 000000215 6531_ $$adefects 000000215 692__ $$aDepartment of Materials Science and Engineering$$041420 000000215 7001_ $$aRyoo, Kunkul 000000215 7001_ $$uOregon Graduate Center$$041351 000000215 8564_ $$96a4fe9b9-1a09-4b86-8344-50efa664aca6$$s2988309$$uhttps://digitalcollections.ohsu.edu/record/215/files/215_etd.pdf 000000215 905__ $$a/rest/prod/9k/41/zd/48/9k41zd48h 000000215 909CO $$ooai:digitalcollections.ohsu.edu:215$$pstudent-work 000000215 980__ $$aTheses and Dissertations