000000256 001__ 256
000000256 005__ 20231130114544.0
000000256 0247_ $$2DOI$$a10.6083/M4X0650J
000000256 037__ $$aETD
000000256 245__ $$aFault simulation of a wafer-scale neural network
000000256 260__ $$bOregon Graduate Center
000000256 269__ $$a1988
000000256 336__ $$aThesis
000000256 502__ $$bM.S.
000000256 540__ $$fCC BY
000000256 542__ $$fIn copyright - single owner
000000256 6531_ $$acomputer network architectures
000000256 6531_ $$aneural circuitry
000000256 692__ $$aDepartment of Computer Science and Engineering$$041405
000000256 7001_ $$aMay, Norman L.
000000256 7001_ $$uOregon Graduate Center$$041351
000000256 8564_ $$966afa80d-bfc1-44fb-823c-3ec2560b752c$$s3171910$$uhttps://digitalcollections.ohsu.edu/record/256/files/256_etd.pdf
000000256 905__ $$a/rest/prod/7w/62/f8/21/7w62f821k
000000256 909CO $$ooai:digitalcollections.ohsu.edu:256$$pstudent-work
000000256 980__ $$aTheses and Dissertations