000000003 001__ 3
000000003 005__ 20231130104328.0
000000003 0247_ $$2DOI$$a10.6083/M4KW5CXM
000000003 037__ $$aETD
000000003 245__ $$aLaser processing optimization for semiconductor based devices
000000003 269__ $$a1997
000000003 336__ $$aDissertation
000000003 502__ $$bPh.D.
000000003 502__ $$gApplied Physics
000000003 540__ $$fCC BY
000000003 542__ $$fIn copyright - single owner
000000003 650__ $$aLasers$$021338
000000003 650__ $$aSemiconductors$$025858
000000003 6531_ $$areliability
000000003 6531_ $$asemiconductor wafers
000000003 6531_ $$adefects
000000003 6531_ $$aindustrial applications
000000003 692__ $$aDepartment of Electrical Engineering and Applied Physics$$041410
000000003 7001_ $$aSun, Yunlong$$uOregon Graduate Institute of Science and Technology$$041352
000000003 8564_ $$9f4a1ccc5-ae42-4e3a-b66a-6df7a078d3a1$$s62635557$$uhttps://digitalcollections.ohsu.edu/record/3/files/3_etd.pdf
000000003 905__ $$a/rest/prod/47/42/99/12/47429912h
000000003 909CO $$ooai:digitalcollections.ohsu.edu:3$$pstudent-work
000000003 980__ $$aTheses and Dissertations