TY  - GEN
DO  - 10.6083/M4WQ01SV
DO  - DOI
AD  - Oregon Graduate Institute of Science and Technology
T1  - Investigation of parameters affecting polysilicon characteristics for laser annealed polysilicon thin film transistors
DA  - 1999
AU  - Marmorstein, Aaron M.
L1  - https://digitalcollections.ohsu.edu/record/703/files/705_etd.pdf
PB  - Oregon Graduate Institute of Science and Technology
PY  - 1999
ID  - 703
L4  - https://digitalcollections.ohsu.edu/record/703/files/705_etd.pdf
KW  - design and construction
KW  - electronic
KW  - materials
KW  - integrated circuits
KW  - transistors
KW  - thin film transistors
TI  - Investigation of parameters affecting polysilicon characteristics for laser annealed polysilicon thin film transistors
Y1  - 1999
L2  - https://digitalcollections.ohsu.edu/record/703/files/705_etd.pdf
LK  - https://digitalcollections.ohsu.edu/record/703/files/705_etd.pdf
UR  - https://digitalcollections.ohsu.edu/record/703/files/705_etd.pdf
ER  -