000007943 001__ 7943
000007943 005__ 20240111104853.0
000007943 0247_ $$2DOI$$a10.6083/M41C1V30
000007943 037__ $$aETD
000007943 245__ $$aCharacterization of NMOS and PMOS transistors on silicon-on-insulator substrates
000007943 260__ $$bOregon Health and Science University
000007943 269__ $$a1997-08-01
000007943 336__ $$aThesis
000007943 502__ $$bM.S.
000007943 650__ $$aSemiconductors$$025858
000007943 692__ $$aDepartment of Electrical and Computer Engineering$$041409
000007943 7001_ $$aMorrison, William J.
000007943 7001_ $$uOregon Graduate Institute of Science and Technology$$041352
000007943 8564_ $$903b9f31f-8cc0-4bbb-be4a-7eb45043557a$$s1984132$$uhttps://digitalcollections.ohsu.edu/record/7943/files/199708.morrison.james.pdf
000007943 905__ $$a/rest/prod/5q/47/rp/31/5q47rp31x
000007943 909CO $$ooai:digitalcollections.ohsu.edu:7943$$pstudent-work
000007943 980__ $$aTheses and Dissertations