@article{ETD,
      school = {M.S.},
      author = {Dawes, Mary and },
      url = {http://digitalcollections.ohsu.edu/record/7967},
      title = {AC/DC characterization of NMOS and PMOS degradation under  AC/DC stress},
      publisher = {Oregon Health and Science University},
      number = {ETD},
      doi = {https://doi.org/10.6083/M49P2ZS5},
      recid = {7967},
      address = {1989-05-01},
}