000007967 001__ 7967
000007967 005__ 20240124114255.0
000007967 0247_ $$2DOI$$a10.6083/M49P2ZS5
000007967 037__ $$aETD
000007967 245__ $$aAC/DC characterization of NMOS and PMOS degradation under AC/DC stress
000007967 260__ $$bOregon Health and Science University
000007967 269__ $$a1989-05-01
000007967 336__ $$aThesis
000007967 502__ $$bM.S.
000007967 6531_ $$aelectronic transistors
000007967 7001_ $$aDawes, Mary
000007967 7001_ $$uOregon Graduate Center$$041351
000007967 8564_ $$9a3565b76-4878-4372-8f6c-e9860372bba9$$s14835941$$uhttps://digitalcollections.ohsu.edu/record/7967/files/198905.dawes.mary.pdf
000007967 905__ $$a/rest/prod/xp/68/kg/94/xp68kg944
000007967 909CO $$ooai:digitalcollections.ohsu.edu:7967$$pstudent-work
000007967 980__ $$aTheses and Dissertations