TY  - THES
AD  - Oregon Graduate Institute of Science and Technology
AU  - Chandrasekaran, Verivada
DA  - 1992-07-01
DO  - 10.6083/M4C827FG
DO  - DOI
ID  - 7986
KW  - Silicon
L1  - https://digitalcollections.ohsu.edu/record/7986/files/199207.chandrasekaran.verivada.pdf
L2  - https://digitalcollections.ohsu.edu/record/7986/files/199207.chandrasekaran.verivada.pdf
L4  - https://digitalcollections.ohsu.edu/record/7986/files/199207.chandrasekaran.verivada.pdf
LK  - https://digitalcollections.ohsu.edu/record/7986/files/199207.chandrasekaran.verivada.pdf
PB  - Oregon Health and Science University
PY  - 1992-07-01
T1  - Defects in dual implanted silicon
TI  - Defects in dual implanted silicon
UR  - https://digitalcollections.ohsu.edu/record/7986/files/199207.chandrasekaran.verivada.pdf
Y1  - 1992-07-01
ER  -