000007986 001__ 7986
000007986 005__ 20240111104854.0
000007986 0247_ $$2DOI$$a10.6083/M4C827FG
000007986 037__ $$aETD
000007986 245__ $$aDefects in dual implanted silicon
000007986 260__ $$bOregon Health and Science University
000007986 269__ $$a1992-07-01
000007986 336__ $$aThesis
000007986 502__ $$bM.S.
000007986 650__ $$aSilicon$$026004
000007986 692__ $$aDepartment of Electrical and Computer Engineering$$041409
000007986 7001_ $$aChandrasekaran, Verivada
000007986 7001_ $$uOregon Graduate Institute of Science and Technology$$041352
000007986 8564_ $$9a026078f-1e53-471d-a4a3-ae692d269c4b$$s22156716$$uhttps://digitalcollections.ohsu.edu/record/7986/files/199207.chandrasekaran.verivada.pdf
000007986 905__ $$a/rest/prod/q8/11/kk/29/q811kk29x
000007986 909CO $$ooai:digitalcollections.ohsu.edu:7986$$pstudent-work
000007986 980__ $$aTheses and Dissertations