TY - GEN AD - Oregon Graduate Center AU - Dobrilla, Paolo DA - 1986 DO - 10.6083/M4KH0K8W DO - DOI ID - 96 KW - Semiconductors KW - defects L1 - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf L2 - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf L4 - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf LK - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf PB - Oregon Graduate Center PY - 1986 T1 - Infrared transmittance study of GaAs: Mapping stress, dislocation, and EL2 distributions TI - Infrared transmittance study of GaAs: Mapping stress, dislocation, and EL2 distributions UR - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf Y1 - 1986 ER -