TY  - GEN
DO  - 10.6083/M4KH0K8W
DO  - DOI
AD  - Oregon Graduate Center
T1  - Infrared transmittance study of GaAs: Mapping stress, dislocation, and EL2 distributions
DA  - 1986
AU  - Dobrilla, Paolo
L1  - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf
PB  - Oregon Graduate Center
PY  - 1986
ID  - 96
L4  - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf
KW  - Semiconductors
KW  - defects
TI  - Infrared transmittance study of GaAs: Mapping stress, dislocation, and EL2 distributions
Y1  - 1986
L2  - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf
LK  - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf
UR  - https://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf
ER  -