000000096 001__ 96
000000096 005__ 20231130114536.0
000000096 0247_ $$2DOI$$a10.6083/M4KH0K8W
000000096 037__ $$aETD
000000096 245__ $$aInfrared transmittance study of GaAs: Mapping stress, dislocation, and EL2 distributions
000000096 260__ $$bOregon Graduate Center
000000096 269__ $$a1986
000000096 336__ $$aDissertation
000000096 502__ $$bPh.D.
000000096 540__ $$fCC BY
000000096 542__ $$fIn copyright - single owner
000000096 650__ $$aSemiconductors$$025858
000000096 6531_ $$adefects
000000096 692__ $$aDepartment of Electrical Engineering and Applied Physics$$041410
000000096 7001_ $$aDobrilla, Paolo
000000096 7001_ $$uOregon Graduate Center$$041351
000000096 8564_ $$9be41a035-8238-4bde-a841-2133b94ee074$$s8716240$$uhttps://digitalcollections.ohsu.edu/record/96/files/96_etd.pdf
000000096 905__ $$a/rest/prod/7p/88/cg/52/7p88cg523
000000096 909CO $$ooai:digitalcollections.ohsu.edu:96$$pstudent-work
000000096 980__ $$aTheses and Dissertations