Infrared transmittance study of GaAs: Mapping stress, dislocation, and EL2 distributions
Dobrilla, Paolo;
1986

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Title
Infrared transmittance study of GaAs: Mapping stress, dislocation, and EL2 distributions
Creator
Dobrilla, Paolo
Oregon Graduate Center
Publisher
Oregon Graduate Center
Date
1986
Subjects
Keywords
DOI
https://doi.org/10.6083/M4KH0K8W
Content Type
Dissertation
Degree Type
Ph.D.
Department
Department of Electrical Engineering and Applied Physics
Copyright Status
Usage Statement
Record ID
96
Record Created
2023-06-29
Record Appears in
Organizations > Departments and Divisions > Legacy Departments (UOMS/OGC/OGI) > Department of Electrical Engineering and Applied Physics
OHSU Works > Student Work > Degrees > Doctor of Philosophy (Ph.D.)
OHSU Works > Student Work > Dissertations
Theses and Dissertations
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