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The microstructural effects of metallization and heat treatment on thin gate oxide for use in sub-micron MOSFETs
McCarthy, John M.
;
1996
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Title
The microstructural effects of metallization and heat treatment on thin gate oxide for use in sub-micron MOSFETs
Creator
McCarthy, John M.
Oregon Graduate Institute of Science and Technology
Publisher
Oregon Graduate Institute of Science and Technology
Date
1996
Keywords
metallic films
;
metal oxide semiconductor field-effect transistors
;
sputtering (physics)
DOI
https://doi.org/10.6083/M4F769GJ
Content Type
Thesis
Degree Type
Ph.D.
Department
Department of Materials Science and Engineering
Copyright Status
In copyright - single owner
Usage Statement
CC BY
Record ID
12
Record Created
2023-06-29
Record Appears in
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UOMS/OGC/OGI Legacy Departments
>
Department of Materials Science and Engineering
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Doctor of Philosophy (Ph.D.)
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