login
Menu
Search
Browse…
Collections
All works
Library databases
Subject guides
Archival finding aids
Web archives
Get info…
Digital Collections Guide
Library Home
Historical Collections Home
Get help…
Ask a question
Chat with us
Meet with a library expert
Attend a workshop
login
Electrical characterization of high-k gate dielectrics for high frequency application
He, Weiming
;
2004
Download
Formats
Format
BibTeX
View
Download
MARCXML
View
Download
TextMARC
View
Download
MARC
View
Download
DublinCore
View
Download
EndNote
View
Download
NLM
View
Download
RefWorks
View
Download
RIS
View
Download
Add to Basket
Files
Details
Title
Electrical characterization of high-k gate dielectrics for high frequency application
Creator
He, Weiming
Oregon Health and Science University
Publisher
Oregon Health and Sciences University
Oregon Health and Science University
Date
2004-12-01
DOI
https://doi.org/10.6083/M4CJ8BRS
Content Type
Dissertation
Degree Type
Ph.D.
School
OGI School of Science and Engineering
Copyright Status
In copyright - single owner
Record ID
2360
Record Created
2023-06-29
Record Appears in
OHSU Works
>
Student Work
>
Degrees
>
Doctor of Philosophy (Ph.D.)
Organizations
>
Schools
>
OGI School of Science and Engineering (2001-2008)
OHSU Works
>
Student Work
>
Dissertations
Theses and Dissertations
Featured Collections
All Records
PDF
Statistics
Downloads
Unique Downloads
Views
Unique Views
from
to
By Days
By Months
By Years
Update
Export
Download Full History